Analog Devices Inc. ADAQ23875 μModule® Data Acquisition Solution
Analog Devices Inc. ADAQ23875 μModule® Data Acquisition Solution is a System-in-Package (SIP) integrating multiple common signal processing and conditioning blocks in a single device. These blocks include low noise, fully differential Analog-to-Digital Converter (ADC) Driver (FDA), a stable reference buffer, and a high speed, 16-bit, 15 MSPS Successive Approximation Register (SAR) ADC. Using Analog Devices, Inc., iPassives® technology, the ADAQ23875 also incorporates crucial passive components with superior matching and drift characteristics to minimize temperature dependent error sources and to offer optimized performance. The fast settling of the ADC driver stage, with fully differential or single-ended to differential input and no latency of the SAR ADC, provides a unique solution for high channel count multiplexed signal chain architectures and control loop applications.
The Analog Devices Inc. ADAQ2387 μModule is offered in a small footprint, 9.0mm x 9mm CSP_BGA package, enabling smaller form factor instruments without sacrificing performance. Single, 5.0V supply operation is possible while achieving optimum performance from the device. The ADAQ23875 features a serial Low Voltage Differential Signaling (LVDS) digital interface with one-lane or two-lane output modes, allowing the user to optimize the interface data rate for each application. The specified operating temperature range of the μModule is from -40°C to +85°C.
Features
- Integrated fully differential ADC driver with signal scaling
- Wide input common range
- High common-mode rejection
- Single-ended to differential conversion
- ±2.048V input range with 4.096V REFBUF
- Critical passive components
- 0.005% precision-matched resistor array for FDA
- Low power, dynamic power scaling, power-down mode
- 15MSPS throughput with no pipeline delay
- ±0.4 LSB typical, ±1 LSB maximum integral nonlinearity
- 89dB (typical) Signal-to-Noise + Distortion (SINAD) at 1kHz
- -115dB at 1kHz, -106dB at 400kHz Total Harmonic Distortion (THD)
- 0.005% FS typical gain error
- ±1 ppm/°C maximum gain error drift
- On-board reference buffer with VCMO generation
- Serial LVDS interface
- Wide -40°C to +85°C operating temperature range
- 9.0mm x 9.0mm, 0.8mm pitch, 100-ball BGA package
- RoHS compliant
Applications
- ATE (Automatic Test Equipment)
- Data acquisition
- Hardware in the Loop (HiL)
- Power analyzers
- Nondestructive test (acoustic emissions)
- Mass spectrometry
- Traveling wave fault location
- Medical imaging and instruments
- Ultrasonic flowmeters
Development Tools
Analog Devices Inc. Placa de evaluación EVAL-ADAQ23875FMCZ
Plataforma de demostración y desarrollo para la solución de adquisición de datos μModule® ADAQ23875.
Block Diagram
Package Outline
Additional Resources
Easily Calculate Sampling Clock Jitter for Isolated, Precision High-Speed DAQs
Jitter in the signal (or clock) controlling the S&H switch in an ADC impacts the SNR performance of precision, high-speed DAQ signal chains. Understanding the error sources that contribute to the overall jitter is important when selecting components.